Semimap COREMA Contactless Resistivity Mapping for GaAs and SiC
Homepage Semimap Scientific Instruments GmbH develops measurement systems for to evaluate electrical properties of semi-insulating compound semiconductor substrates. COREMA-WT, COREMA-RM and CORMA-VT characterize substrate properties with respect to resistivity, mobility and carrier concentration for GaAs, InP, SiC, GaN and CdTe
Sprache: Englisch
Electrical semiconductor characterization
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